Integrating hundreds of integrated appications for machine vision systems using a revolutionary iconic graphical programming software.
3D imaging using SMI Scanning Morie Interferometry.
Working with factory floor designers on inspection and high speed quality applications covering Semiconductor, Industrial Manufacturing, Laboratory Automation, Pharmaceutical Packaging, Electronics, and Robotic Guidance.
Automated model PPT861-SH(TM) provides precise measurement of critical device parameters. Utilizing SMI(TM) (Scanning Moire Interferometry(TM)) 3D technology, it allows 100% production inspection of devices in strips, including BGA, CSP, and LGA. All scanning and motion parameters are programmable. Typical measurements include coplanarity, ball height, surface flatness, and true position. Inline or batch processing inspection system suits small lot production.
